Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale.
M. GirardTristan DuboisP. HoffmannGeneviève DuchampPublished in: Microelectron. Reliab. (2018)
Keyphrases
- gallium arsenide
- field effect transistors
- high sensitivity
- high noise
- low signal to noise ratio
- high speed
- image noise
- image structure
- signal to noise ratio
- noise level
- additive noise
- random noise
- noise model
- noise reduction
- noisy data
- scale space
- image processing
- signal noise ratio
- frequency response
- missing data
- power spectrum
- high levels
- high density
- input data
- analog circuits
- noise free
- high power
- low cost
- artificial neural networks
- data sets