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Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling.

Siham HairoudTristan DuboisAngelique TetelinGeneviève Duchamp
Published in: EMC Compo (2013)
Keyphrases
  • image processing
  • data acquisition
  • neural network
  • image segmentation
  • objective function
  • multi objective optimization
  • modeling language
  • machine learning
  • artificial intelligence
  • expert systems
  • integrated circuit