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Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror.

Corinne BestoryFrançois MarcS. DuzellierHervé Levi
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • highly reliable
  • low voltage
  • statistical analysis
  • neural network
  • information systems
  • wireless sensor networks
  • high speed
  • field of view
  • short circuit
  • software aging