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Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses.
Benoit Lambert
Nathalie Malbert
Nathalie Labat
Frédéric Verdier
André Touboul
P. Huguet
R. Bonnet
G. Pataut
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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noise level
post processing
power consumption
random noise
image quality
missing data
noise reduction
radio frequency
neural network
image sequences
noisy data
arbitrary shape
noise model
noise free