Wilfrid Claeys

Publication Activity (10 Years)

Years Active: 1999-2014
Publications (10 Years): 0

Top Topics

Sensor Data Streams

Electrical Power

High Temperature

Top Venues

Microelectron. J.

Publications

Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45 (5) (2014)
Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire
Joule expansion imaging techniques on microlectronic devices. Microelectron. J. 40 (9) (2009)
Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS (2008)
Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectron. Reliab. 48 (2) (2008)
Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio
Dynamic Surface Temperature Measurements in ICs. Proc. IEEE 94 (8) (2006)
Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire
Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectron. Reliab. 46 (9-11) (2006)
Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire
ElectroStatic Discharge Fault Localization by Laser Probing. Microelectron. Reliab. 45 (9-11) (2005)
Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby
Applications of temperature phase measurements to IC testing. Microelectron. Reliab. 44 (1) (2004)
Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectron. J. 35 (10) (2004)
Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectron. J. 35 (10) (2004)
Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys
Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Trans. Reliab. 53 (2) (2004)
Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectron. Reliab. 43 (9-11) (2003)
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43 (9-11) (2003)
Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys
Laser diode COFD analysis by thermoreflectance microscopy. Microelectron. Reliab. 41 (9-10) (2001)
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
Thermal coupling in integrated circuits: application to thermal testing. IEEE J. Solid State Circuits 36 (1) (2001)
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
Thermal Testing: Fault Location Strategies. VTS (2000)
Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto
Differential Thermal Testing: An Approach to its Feasibility. J. Electron. Test. 14 (1-2) (1999)
Véronique Quintard, Stefan Dilhaire, Tam Phan, Wilfrid Claeys
Temperature measurements of metal lines under current stress by high-resolution laser probing. IEEE Trans. Instrum. Meas. 48 (1) (1999)