M. Amine Salhi

Publication Activity (10 Years)

Years Active: 2003-2009
Publications (10 Years): 0

Publications

Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire
Joule expansion imaging techniques on microlectronic devices. Microelectron. J. 40 (9) (2009)
Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS (2008)
Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectron. Reliab. 48 (2) (2008)
Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire
Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectron. Reliab. 46 (9-11) (2006)
Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire
ElectroStatic Discharge Fault Localization by Laser Probing. Microelectron. Reliab. 45 (9-11) (2005)
Josep Altet, Antonio Rubio, M. Amine Salhi, J. L. Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov
Sensing temperature in CMOS circuits for Thermal Testing. VTS (2004)
Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectron. J. 35 (10) (2004)
Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectron. Reliab. 43 (9-11) (2003)