Sensing temperature in CMOS circuits for Thermal Testing.
Josep AltetAntonio RubioM. Amine SalhiJ. L. GálvezStefan DilhaireAshish SyalAndré IvanovPublished in: VTS (2004)
Keyphrases
- delay insensitive
- high speed
- analog vlsi
- thermal imaging
- circuit design
- high temperature
- infrared
- focal plane
- air temperature
- vlsi circuits
- room temperature
- heat transfer
- cmos technology
- thermal conductivity
- image sensor
- low power
- random access memory
- visible spectrum
- chip design
- relative humidity
- test cases
- floating gate
- solar radiation
- air conditioning
- low voltage
- low cost
- sensor networks
- analog circuits
- real time
- finite element analysis
- design considerations
- power plant
- neural network