Josep Altet

Publication Activity (10 Years)

Years Active: 1997-2023
Publications (10 Years): 10

Top Topics

Power Consumption

Thermal Imaging

Air Conditioning

Design Methodology

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Martí Caro, Hamid Tabani, Jaume Abella, Francesc Moll, Enric Morancho, Ramon Canal, Josep Altet, Antonio Calomarde, Francisco J. Cazorla, Antonio Rubio, Pau Fontova, Jordi Fornt
An automotive case study on the limits of approximation for object detection. J. Syst. Archit. 138 (2023)
Martí Caro, Hamid Tabani, Jaume Abella, Francesc Moll, Enric Morancho, Ramon Canal, Josep Altet, Antonio Calomarde, Francisco J. Cazorla, Antonio Rubio, Pau Fontova, Jordi Fornt
An Automotive Case Study on the Limits of Approximation for Object Detection. CoRR (2023)
Josep Altet, Xavier Aragones, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements. Sensors 23 (16) (2023)
Jordi Fornt, Pau Fontova-Musté, Martí Caro, Jaume Abella, Francesc Moll, Josep Altet, Christoph Studer
An Energy-Efficient GeMM-Based Convolution Accelerator With On-the-Fly im2col. IEEE Trans. Very Large Scale Integr. Syst. 31 (11) (2023)
Jordi Fornt, Leixin Jin, Imanol Etxezarreta, Pau Fontova, Josep Altet, Antonio Calomarde, Enric Morancho, Francesc Moll, Antonio Rubio
Two examples of approximate arithmetic to reduce hardware complexity and power consumption. DCIS (2022)
Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. Sensors 21 (3) (2021)
Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology. Sensors 19 (21) (2019)
Xavier Aragonès, Alex Alvarez, Juan Pablo Rovayo, Josep Altet, Diego Mateo
Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology. DCIS (2019)
Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. IEEE Trans. Instrum. Meas. 68 (8) (2019)
Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. DCIS (2019)
Ferran Reverter, Josep Altet
On-Chip Thermal Testing Using MOSFETs in Weak Inversion. IEEE Trans. Instrum. Meas. 64 (2) (2015)
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45 (5) (2014)
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS (2014)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
Defect-oriented non-intrusive RF test using on-chip temperature sensors. VTS (2013)
Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC (2012)
Didac Gómez, Cédric Dufis, Josep Altet, Diego Mateo, José Luis González
Electro-thermal coupling analysis methodology for RF circuits. Microelectron. J. 43 (9) (2012)
Josep Altet, Diego Mateo, Didac Gómez
On line monitoring of RF power amplifiers with embedded temperature sensors. IOLTS (2012)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
Testing RF circuits with true non-intrusive built-in sensors. DATE (2012)
Nathalie Deltimple, José Luis González, Josep Altet, Yohann Luque, Eric Kerherve
Design of a fully integrated CMOS self-testable RF power amplifier using a thermal sensor. ESSCIRC (2012)
Didac Gómez, Josep Altet, Diego Mateo
On the Use of Static Temperature Measurements as Process Variation Observable. J. Electron. Test. 28 (5) (2012)
Marvin Onabajo, Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, José Silva-Martínez
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2011)
Joan Mauricio, Francesc Moll, Josep Altet
Monitor strategies for variability reduction considering correlation between power and timing variability. SoCC (2011)
Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet, Diego Mateo, José Silva-Martínez
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations. J. Electron. Test. 27 (3) (2011)
Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. IOLTS (2010)
Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez
Non-invasive RF built-in testing using on-chip temperature sensors. ITC (2009)
Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS (2008)
Diego Mateo, Josep Altet, Eduardo Aldrete-Vidrio
Electrical characterization of analogue and RF integrated circuits by thermal measurements. Microelectron. J. 38 (2) (2007)
Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio
Dynamic Surface Temperature Measurements in ICs. Proc. IEEE 94 (8) (2006)
Josep Altet, Diego Mateo, José Luis González, Eduardo Aldrete-Vidrio
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements. ISCAS (2006)
Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby
Applications of temperature phase measurements to IC testing. Microelectron. Reliab. 44 (1) (2004)
Josep Altet, Antonio Rubio, M. Amine Salhi, J. L. Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov
Sensing temperature in CMOS circuits for Thermal Testing. VTS (2004)
Josep Altet, Antonio J. Rubio, José Luis Rosselló, Jaume Segura
Structural RFIC device testing through built-in thermal monitoring. IEEE Commun. Mag. 41 (9) (2003)
Josep Altet, André Ivanov, A. Wong
Thermal Testing of Analogue Integrated Circuits: A Case Study. J. Electron. Test. 19 (3) (2003)
Ashish Syal, Victor Lee, André Ivanov, Josep Altet
CMOS Differential and Absolute Thermal Sensors. J. Electron. Test. 18 (3) (2002)
Ashish Syal, Victor Lee, André Ivanov, Josep Altet
CMOS Differential and Absolute Thermal Sensors. IOLTW (2001)
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
Thermal coupling in integrated circuits: application to thermal testing. IEEE J. Solid State Circuits 36 (1) (2001)
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys
Thermal Testing: Fault Location Strategies. VTS (2000)
Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto
Differential Thermal Testing: An Approach to its Feasibility. J. Electron. Test. 14 (1-2) (1999)
Josep Altet, Antonio Rubio
Differential Sensing Strategy for Dynamic Thermal Testing of ICs. VTS (1997)
Josep Altet, Antonio Rubio, Hideo Tamamoto
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits. Asian Test Symposium (1997)