Louay Abdallah

Publication Activity (10 Years)

Years Active: 2010-2018
Publications (10 Years): 1

Top Topics

Accurate Estimation

Radially Symmetric

Autocalibration

Top Venues

J. Electron. Test.

Publications

Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. J. Electron. Test. 34 (3) (2018)
Athanasios Dimakos, Martin Andraud, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu, Salvador Mir
Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors. ISVLSI (2015)
John Liaperdos, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Yiorgos Tsiatouhas, Angela Arapoyanni, Xin Li
Fast deployment of alternate analog test using Bayesian model fusion. DATE (2015)
Ayssar Serhan, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
Low-cost EVM built-in test of RF transceivers. IDT (2014)
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS (2014)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
True non-intrusive sensors for RF built-in test. ITC (2013)
Ke Huang, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Salvador Mir, Ahcène Bounceur
Multivariate statistical techniques for analog parametric test metrics estimation. DTIS (2013)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
Defect-oriented non-intrusive RF test using on-chip temperature sensors. VTS (2013)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
Testing RF circuits with true non-intrusive built-in sensors. DATE (2012)
Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler
Accurate estimation of analog test metrics with extreme circuits. ICECS (2012)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma
Experiences with non-intrusive sensors for RF built-in test. ITC (2012)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma
RF Front-End Test Using Built-in Sensors. IEEE Des. Test Comput. 28 (6) (2011)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
Implicit test of high-speed analog circuits using non-intrusive sensors. ECCTD (2011)
Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. Asian Test Symposium (2011)
Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni
Adaptive logical control of RF LNA performances for efficient energy consumption. VLSI-SoC (2010)
Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir
Sensors for built-in alternate RF test. ETS (2010)
Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni
Adaptive Logical Control of RF LNA Performances for Efficient Energy Consumption. VLSI-SoC (Selected Papers) (2010)