Implicit test of high-speed analog circuits using non-intrusive sensors.

Louay Abdallah Haralampos-G. D. Stratigopoulos Salvador Mir

Published in: ECCTD (2011)

Keyphrases

data fusion
analog circuits
high speed
multi sensor
fault diagnosis
digital circuits
neural network
low power
test data
data acquisition
frame rate
artificial intelligence
machine learning
statistical tests
data mining
real time
wavelet packet transform