Alexios Spyronasios

Publication Activity (10 Years)

Years Active: 2007-2011
Publications (10 Years): 0

Publications

Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. Asian Test Symposium (2011)
Alexios Spyronasios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits. IEEE Trans. Instrum. Meas. 60 (6) (2011)
Alexios Spyronasios, Michael G. Dimopoulos, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos
Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets. ISVLSI (2010)
Michael G. Dimopoulos, Alexios Spyronasios, Alkis A. Hatzopoulos
Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits. IOLTS (2010)
Michael G. Dimopoulos, Alexios Spyronasios, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos
Efficient testing of an optical feedback pixel driver using wavelet analysis. ICECS (2010)
Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos
Circuit Implementation of a Supply Current Spectrum Test Method. IEEE Trans. Instrum. Meas. 59 (10) (2010)
Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. DDECS (2008)
Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos, Dimitrios K. Konstantinou
Power supply current testing in the production line of emergency luminaire circuits. ICECS (2008)
Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos
Multiple Parametric Circuit Analysis Tool for Detectability Estimation. ICECS (2007)
Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Evdokimos I. Konstantinidis, Alexios Spyronasios
Design and development of a versatile testing system for analog and mixed-signal circuits. ECCTD (2007)