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Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets.
Alexios Spyronasios
Michael G. Dimopoulos
Nikolaos P. Papadopoulos
Alkis A. Hatzopoulos
Published in:
ISVLSI (2010)
Keyphrases
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integrated circuit
mixed signal
built in self test
test cases
vlsi circuits
low power
multi channel
fault model
multiresolution
fault diagnosis
signal processing
wavelet transform
image processing
image compression
fault detection
electron beam
real time
model based diagnosis
printed circuit boards