Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits.
Alexios SpyronasiosMichael G. DimopoulosAlkis A. HatzopoulosPublished in: IEEE Trans. Instrum. Meas. (2011)
Keyphrases
- wavelet analysis
- mixed signal
- vlsi circuits
- low power
- multi channel
- multiresolution
- feature detection
- wavelet transform
- gaussian function
- detection method
- detection algorithm
- mexican hat
- high speed
- basis functions
- factor analysis
- digital circuits
- low voltage
- multiscale
- built in self test
- low frequency
- low cost
- denoising
- image analysis
- object recognition
- pattern recognition