Low-cost EVM built-in test of RF transceivers.

Ayssar Serhan Louay Abdallah Haralampos-G. D. Stratigopoulos Salvador Mir

Published in: IDT (2014)

Keyphrases

low cost
low power
databases
lightweight
hardware and software
test data
database
genetic algorithm
case study
high quality
search algorithm
computational complexity
supply chain
digital camera
highly efficient