Miquel Vellvehí

Publication Activity (10 Years)

Years Active: 2001-2023
Publications (10 Years): 5

Top Topics

High Temperature

Solder Ball Connect

Semiconductor Devices

Integrated Circuit

Top Venues

IEEE Trans. Ind. Electron.

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Microelectron. J.

Publications

Conrad Ferrer, Oriol Avino-Salvado, Miquel Vellvehí, Xavier Jordà, Xavier Perpiñà
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. IEEE Trans. Instrum. Meas. 72 (2023)
Miquel Vellvehí, Xavier Perpiñà, Javier Leon, Oriol Avino-Salvado, Conrad Ferrer, Xavier Jordà
Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. IEEE Trans. Ind. Electron. 68 (12) (2021)
Manuel Fernandez, Xavier Perpiñà, José Rebollo, Miquel Vellvehí, David Sanchez, Tomás Cabeza, Sergio Llorente, Xavier Jordà
Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices. IEEE Trans. Ind. Electron. 66 (3) (2019)
Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. IEEE Trans. Instrum. Meas. 68 (8) (2019)
Manuel Fernandez, Xavier Perpiñà, Jaume Roig-Guitart, Miquel Vellvehí, Filip Bauwens, Marnix Tack, Xavier Jordà
Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs. IEEE Trans. Ind. Electron. 64 (11) (2017)
Xavier Jordà, Jesús Esarte, Xavier Perpiñà, Miquel Vellvehí, Gorka Argandoña, Maite Aresti
Characterization of phase change material systems using a thermal test device. Microelectron. J. 46 (12) (2015)
Mihaela Alexandru, Viorel Banu, Xavier Jordà, Josep Montserrat, Miquel Vellvehí, Dominique Tournier, José Millán, Philippe Godignon
SiC Integrated Circuit Control Electronics for High-Temperature Operation. IEEE Trans. Ind. Electron. 62 (5) (2015)
Javier Leon, Xavier Perpiñà, Jordi Sacristán, Miquel Vellvehí, Antoni Baldi, Xavier Jordà
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging. IEEE Trans. Ind. Electron. 62 (12) (2015)
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45 (5) (2014)
Javier Leon, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà, Philippe Godignon
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing. ESSDERC (2014)
Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà
Temperature effects on the ruggedness of SiC Schottky diodes under surge current. Microelectron. Reliab. 54 (9-10) (2014)
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS (2014)
Xavier Perpiñà, Xavier Jordà, Javier Leon, Miquel Vellvehí, Daniel Antón, Sergio Llorente
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications. Microelectron. Reliab. 54 (9-10) (2014)
Jiri Jakovenko, J. Formánek, X. Perpiñà, Xavier Jordà, Miquel Vellvehí, Robert J. Werkhoven, Miroslav Husák, J. M. G. Kunen, P. Bancken, P. J. Bolt, A. Gasse
Design methodologies for reliability of SSL LED boards. Microelectron. Reliab. 53 (8) (2013)
Viorel Banu, Philippe Godignon, Mihaela Alexandru, Miquel Vellvehí, Xavier Jordà, José Millán
High temperature-low temperature coefficient analog voltage reference integrated circuit implemented with SiC MESFETs. ESSCIRC (2013)
B. Pardo, A. Gasse, A. Fargeix, Jiri Jakovenko, Robert J. Werkhoven, Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, T. Van Weelden, P. Bancken
Thermal resistance investigations on new leadframe-based LED packages and boards. Microelectron. Reliab. 53 (8) (2013)
Mihaela Alexandru, Viorel Banu, Philippe Godignon, Miquel Vellvehí, José Millán
4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits. ESSDERC (2013)
Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC (2012)
Xavier Perpiñà, Robert J. Werkhoven, Jiri Jakovenko, J. Formánek, Miquel Vellvehí, Xavier Jordà, Jos M. G. Kunen, Peter Bancken, Pieter Jan Bolt
Design for reliability of solid state lighting systems. Microelectron. Reliab. 52 (9-10) (2012)
Luis A. Navarro, Xavier Perpiñà, Miquel Vellvehí, Viorel Banu, Xavier Jordà
Thermal cycling analysis of high temperature die-attach materials. Microelectron. Reliab. 52 (9-10) (2012)
Philippe Godignon, Xavier Jordà, Miquel Vellvehí, Xavier Perpiñà, Viorel Banu, Demetrio López, Juan Barbero, Pierre Brosselard, Silvia Massetti
SiC Schottky Diodes for Harsh Environment Space Applications. IEEE Trans. Ind. Electron. 58 (7) (2011)
Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, José Rebollo, Michel Mermet-Guyennet
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems. IEEE Trans. Ind. Electron. 58 (7) (2011)
Miquel Vellvehí, Xavier Jordà, Philippe Godignon, Carles Ferrer, José Millán
Coupled electro-thermal simulation of a DC/DC converter. Microelectron. Reliab. 47 (12) (2007)
A. Pérez-Tomás, Xavier Jordà, Philippe Godignon, J. L. Gálvez, Miquel Vellvehí, José Millán
IGBT gate driver IC with full-bridge output stage using a modified standard CMOS process. Microelectron. J. 35 (8) (2004)
Xavier Perpiñà, Xavier Jordà, N. Mestres, Miquel Vellvehí, Philippe Godignon, José Millán
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies. Microelectron. J. 35 (10) (2004)
Miquel Vellvehí, David Flores, Xavier Jordà, Salvador Hidalgo, José Rebollo, L. Coulbeck, P. Waind
Design considerations for 6.5 kV IGBT devices. Microelectron. J. 35 (3) (2004)
Jaume Roig, David Flores, Miquel Vellvehí, José Rebollo, José Millán
Reduction of self-heating effect on SOIM devices. Microelectron. Reliab. 42 (1) (2002)
José Luis Merino, Sebastià A. Bota, A. Herms, Josep Samitier, Enric Cabruja, Xavier Jordà, Miquel Vellvehí, J. Bausells, A. Ferré, J. Bigorra
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications. IOLTW (2001)