Oriol Avino-Salvado

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 7

Top Topics

Thermal Imaging

Power Electronics

Top Venues

IEEE Trans. Ind. Electron.

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

Oriol Avino-Salvado, Cyril Buttay, Ferran Bonet, Christophe Raynaud, Pascal Bevilacqua, José Rebollo, Hervé Morel, Xavier Perpiñà
Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. IEEE Trans. Ind. Electron. 71 (5) (2024)
Conrad Ferrer, Oriol Avino-Salvado, Miquel Vellvehí, Xavier Jordà, Xavier Perpiñà
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. IEEE Trans. Instrum. Meas. 72 (2023)
Miquel Vellvehí, Xavier Perpiñà, Javier Leon, Oriol Avino-Salvado, Conrad Ferrer, Xavier Jordà
Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. IEEE Trans. Ind. Electron. 68 (12) (2021)
Besar Asllani, Alberto Castellazzi, Oriol Avino-Salvado, Asad Fayyaz, Hervé Morel, Dominique Planson
VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate. IRPS (2019)
Oriol Avino-Salvado, Hervé Morel, Cyril Buttay, Denis Labrousse, Stéphane Lefebvre
Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode. Microelectron. Reliab. (2018)
Wissam Sabbah, Pierre Bondue, Oriol Avino-Salvado, Cyril Buttay, Hélène Frémont, Alexandrine Guédon-Gracia, Hervé Morel
High temperature ageing of microelectronics assemblies with SAC solder joints. Microelectron. Reliab. (2017)
Wissam Sabbah, Faical Arabi, Oriol Avino-Salvado, Cyril Buttay, L. Théolier, Hervé Morel
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. Microelectron. Reliab. (2017)
Carlos Restrepo, Tine Konjedic, Cristian Guarnizo, Oriol Avino-Salvado, Javier Calvente, Alfonso Romero, Roberto Giral
Simplified Mathematical Model for Calculating the Oxygen Excess Ratio of a PEM Fuel Cell System in Real-Time Applications. IEEE Trans. Ind. Electron. 61 (6) (2014)