Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs.
Oriol Avino-SalvadoCyril ButtayFerran BonetChristophe RaynaudPascal BevilacquaJosé RebolloHervé MorelXavier PerpiñàPublished in: IEEE Trans. Ind. Electron. (2024)