Xavier Perpiñà

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 7

Top Topics

Room Temperature

Integrated Circuit

Top Venues

IEEE Trans. Ind. Electron.

IEEE Trans. Instrum. Meas.

Microelectron. J.

Microelectron. Reliab.

Publications

Oriol Avino-Salvado, Cyril Buttay, Ferran Bonet, Christophe Raynaud, Pascal Bevilacqua, José Rebollo, Hervé Morel, Xavier Perpiñà
Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. IEEE Trans. Ind. Electron. 71 (5) (2024)
Conrad Ferrer, Oriol Avino-Salvado, Miquel Vellvehí, Xavier Jordà, Xavier Perpiñà
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. IEEE Trans. Instrum. Meas. 72 (2023)
Miquel Vellvehí, Xavier Perpiñà, Javier Leon, Oriol Avino-Salvado, Conrad Ferrer, Xavier Jordà
Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. IEEE Trans. Ind. Electron. 68 (12) (2021)
Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. Sensors 21 (3) (2021)
Manuel Fernandez, Xavier Perpiñà, José Rebollo, Miquel Vellvehí, David Sanchez, Tomás Cabeza, Sergio Llorente, Xavier Jordà
Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices. IEEE Trans. Ind. Electron. 66 (3) (2019)
Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. IEEE Trans. Instrum. Meas. 68 (8) (2019)
Manuel Fernandez, Xavier Perpiñà, Jaume Roig-Guitart, Miquel Vellvehí, Filip Bauwens, Marnix Tack, Xavier Jordà
Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs. IEEE Trans. Ind. Electron. 64 (11) (2017)
Xavier Jordà, Jesús Esarte, Xavier Perpiñà, Miquel Vellvehí, Gorka Argandoña, Maite Aresti
Characterization of phase change material systems using a thermal test device. Microelectron. J. 46 (12) (2015)
Javier Leon, Xavier Perpiñà, Jordi Sacristán, Miquel Vellvehí, Antoni Baldi, Xavier Jordà
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging. IEEE Trans. Ind. Electron. 62 (12) (2015)
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45 (5) (2014)
Javier Leon, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà, Philippe Godignon
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing. ESSDERC (2014)
Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà
Temperature effects on the ruggedness of SiC Schottky diodes under surge current. Microelectron. Reliab. 54 (9-10) (2014)
Xavier Perpiñà, Xavier Jordà, Javier Leon, Miquel Vellvehí, Daniel Antón, Sergio Llorente
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications. Microelectron. Reliab. 54 (9-10) (2014)
B. Pardo, A. Gasse, A. Fargeix, Jiri Jakovenko, Robert J. Werkhoven, Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, T. Van Weelden, P. Bancken
Thermal resistance investigations on new leadframe-based LED packages and boards. Microelectron. Reliab. 53 (8) (2013)
Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC (2012)
Xavier Perpiñà, Robert J. Werkhoven, Jiri Jakovenko, J. Formánek, Miquel Vellvehí, Xavier Jordà, Jos M. G. Kunen, Peter Bancken, Pieter Jan Bolt
Design for reliability of solid state lighting systems. Microelectron. Reliab. 52 (9-10) (2012)
Luis A. Navarro, Xavier Perpiñà, Miquel Vellvehí, Viorel Banu, Xavier Jordà
Thermal cycling analysis of high temperature die-attach materials. Microelectron. Reliab. 52 (9-10) (2012)
Viorel Banu, Philippe Godignon, Xavier Perpiñà, Xavier Jordà, José Millán
Enhanced power cycling capability of SiC Schottky diodes using press pack contacts. Microelectron. Reliab. 52 (9-10) (2012)
Ignasi Cortés, Xavier Perpiñà, Jesús Urresti, Xavier Jordà, José Rebollo
Study of layout influence on ruggedness of NPT-IGBT devices by physical modelling. Microelectron. Reliab. 52 (9-10) (2012)
Xavier Perpiñà, Jean-François Serviere, Jesús Urresti-Ibañez, Ignasi Cortés, Xavier Jordà, Salvador Hidalgo, José Rebollo, Michel Mermet-Guyennet
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions. IEEE Trans. Ind. Electron. 58 (7) (2011)
Philippe Godignon, Xavier Jordà, Miquel Vellvehí, Xavier Perpiñà, Viorel Banu, Demetrio López, Juan Barbero, Pierre Brosselard, Silvia Massetti
SiC Schottky Diodes for Harsh Environment Space Applications. IEEE Trans. Ind. Electron. 58 (7) (2011)
Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, José Rebollo, Michel Mermet-Guyennet
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems. IEEE Trans. Ind. Electron. 58 (7) (2011)
T. Lhommeau, Xavier Perpiñà, C. Martin, Régis Meuret, Michel Mermet-Guyennet, Moussa Karama
Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications. Microelectron. Reliab. 47 (9-11) (2007)
Xavier Perpiñà, Xavier Jordà, N. Mestres, Miquel Vellvehí, Philippe Godignon, José Millán
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies. Microelectron. J. 35 (10) (2004)