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Temperature effects on the ruggedness of SiC Schottky diodes under surge current.
Javier Leon
Xavier Perpiñà
Viorel Banu
Josep Montserrat
Maxime Berthou
Miquel Vellvehí
Philippe Godignon
Xavier Jordà
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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