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Experts
- Yuming Zhang
- M. Vasudevan
- N. Chandrasekhar
- Marcelo Kleber Felisberto
- Tania Mezzadri Centeno
- S. Chokkalingham
- Radovan Kovacevic
- Yue Cao
- Dilip Kumar Pratihar
- Franz Niedereder
- Seung Ho Lee
- J. Choi
- Jacques A. de Guise
- Heinz Hackl
- J. Y. Park
- Giovanni De Sanctis
- Seow Chuan Lim
- Jeongjin Lee
- Miquel Vellvehí
- Yaguang Zhu
- Xavier Perpiñà
- Huabin Chen
- Sang-Bae Lee
- Wanjin Guo
- David E. Cooper
- Przemyslaw Mackowiak
- D. Vyleghzanin
- Yu Ming Zhang
- Yihan Luan
- Jiwan Kim
- Sylvain Deschênes
- YuMing Zhang
- Allan Vieira
- Steven Y. Liang
- Le Teng
- Yingtao Tian
- Rupesh Raj Karn
- Qiang Ye
- N. J. Blundell
Venues
- J. Intell. Manuf.
- Sensors
- IEEE Trans. Control. Syst. Technol.
- AIM
- IEEE Robotics Autom. Lett.
- Robotics Comput. Integr. Manuf.
- Int. J. Comput. Integr. Manuf.
- J. Intell. Robotic Syst.
- Medical Imaging: Image Processing
- Multim. Tools Appl.
- IEEE CAA J. Autom. Sinica
- Simul.
- ICCSPA
- IEEE Trans. Ind. Electron.
- CoRR
- KES
- Comput. Vis. Image Underst.
- Expert Syst. Appl.
- ISIE
- CBMS
- ISNN (3)
- IEEE Trans. Neural Networks Learn. Syst.
- Ind. Robot
- ICASSP
- IEEE Access
- SEAL
- IECON
- J. Comput. Des. Eng.
- CASE
- URAI
- Behav. Inf. Technol.
- MIPRO
- Prod. Eng.
- BroadBandCom
- IEEE Signal Process. Lett.
- Medical Imaging: Computer-Aided Diagnosis
- IEEE Congress on Evolutionary Computation
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