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Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode.
Oriol Avino-Salvado
Hervé Morel
Cyril Buttay
Denis Labrousse
Stéphane Lefebvre
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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low voltage
transmission line
computer simulation
electrical properties
short circuit
neural network
future development