Defect-oriented non-intrusive RF test using on-chip temperature sensors.

Louay Abdallah Haralampos-G. D. Stratigopoulos Salvador Mir Josep Altet

Published in: VTS (2013)

Keyphrases

high speed
low cost
machine learning
information retrieval
image processing
relevance feedback
database
learning algorithm
low power
radio frequency
defect detection