Login / Signup

Applications of temperature phase measurements to IC testing.

Josep AltetJean-Michel RampnouxJean-Christophe BatsaleStefan DilhaireAntonio RubioWilfrid ClaeysStéphane Grauby
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • phase difference
  • surface temperature
  • learning phase
  • testing phase
  • integrated circuit
  • real world
  • image processing
  • test data
  • training phase
  • databases
  • data mining
  • website
  • image segmentation