TESTING PHASE
Experts
- Rong Jin
- Dieter Hogrefe
- Julian Ahrens
- Jie Feng
- Yan Yan
- Lia Ahrens
- Hang Zhang
- Dirk Habich
- Huichu Zhang
- Zhenhui Li
- Bonggun Shin
- Guangyi Liu
- Yeachan Kim
- Han Xu
- Roland Denis
- Garry Terii
- Bowen Zhou
- Seongyeon Kim
- Fatemeh Ashrafi
- Elie Bretin
- Hans D. Schotten
- Yingyao Wang
- Neil Hernández-Gress
- Tiejun Zhao
- Zhuoning Yuan
- Ihyeok Seo
- Seyed Mohammad Razavizadeh
- Xiaodong He
- Hua Wei
- Mohammad Amin Sheikhi
- Kai Xu
- Alexander Cloninger
- Miguel González-Mendoza
- Tianbao Yang
- Simon Masnou
- Xiuyuan Cheng
- Yuanhao Xiong
- Wolfgang Lehner
- Lucas Woltmann
Venues
- CoRR
- ICASSP
- Sensors
- ITC
- NeurIPS
- Sci. China Inf. Sci.
- IEEE Access
- J. Syst. Softw.
- ICCE
- NeuroImage
- CIKM
- ERCIM News
- URAI
- KDD
- ESEM
- MLCAD
- RoboSoft
- J. Supercomput.
- EAI Endorsed Trans. Security Safety
- IAS
- CLiC-it
- IACR Cryptol. ePrint Arch.
- FNC/MobiSPC
- IEA/AIE
- ACI
- LLM@AIED
- SEW
- J. Comput. Phys.
- Pattern Recognit.
- Nursing Informatics
- IEEE Trans. Signal Process.
- Comput. Educ.
- ISSADS
- AAAI Fall Symposium: AI and Consciousness
- AHFE (6)
- ICLR
- SODA
- WSC
- EURO-DAC
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