TESTING PHASE
Experts
- Rong Jin
- Lia Ahrens
- Hang Zhang
- Dirk Habich
- Julian Ahrens
- Dieter Hogrefe
- Jie Feng
- Yan Yan
- Hans D. Schotten
- Elie Bretin
- Yingyao Wang
- Tiejun Zhao
- Zhuoning Yuan
- Neil Hernández-Gress
- Huichu Zhang
- Guangyi Liu
- Zhenhui Li
- Bonggun Shin
- Yeachan Kim
- Roland Denis
- Han Xu
- Seongyeon Kim
- Bowen Zhou
- Garry Terii
- Fatemeh Ashrafi
- Simon Masnou
- Xiuyuan Cheng
- Yuanhao Xiong
- Lucas Woltmann
- Wolfgang Lehner
- Xiaodong He
- Hua Wei
- Ihyeok Seo
- Seyed Mohammad Razavizadeh
- Kai Xu
- Mohammad Amin Sheikhi
- Miguel González-Mendoza
- Alexander Cloninger
- Tianbao Yang
Venues
- CoRR
- ICASSP
- Sensors
- NeurIPS
- Sci. China Inf. Sci.
- ITC
- NeuroImage
- ICCE
- J. Syst. Softw.
- IEEE Access
- ERCIM News
- CIKM
- ESEM
- URAI
- KDD
- IEEE Trans. Signal Process.
- Comput. Educ.
- ISSADS
- AAAI Fall Symposium: AI and Consciousness
- AHFE (6)
- ICLR
- Nursing Informatics
- SODA
- CF
- J. Comput. Phys.
- Pattern Recognit.
- SEW
- Comput. Chem. Eng.
- icSPORTS
- EURO-DAC
- WSC
- IACR Cryptol. ePrint Arch.
- FNC/MobiSPC
- EAI Endorsed Trans. Security Safety
- IAS
- CLiC-it
- J. Supercomput.
- MLCAD
- LLM@AIED
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