TESTING PHASE
Experts
- Rong Jin
- Tiejun Zhao
- Bowen Zhou
- Lucas Woltmann
- Elie Bretin
- Zhenhui Li
- Huichu Zhang
- Dirk Habich
- Xinshi Zang
- Yuanhao Xiong
- Mohammad Amin Sheikhi
- Yeachan Kim
- Julian Ahrens
- Yong Li
- Claudio Hartmann
- Seongyeon Kim
- Lia Ahrens
- Yan Yan
- Ihyeok Seo
- Hua Wei
- Victor Chang
- Parisa Memarmoshrefi
- Wolfgang Lehner
- Jie Feng
- Youzheng Wu
- Guanjie Zheng
- Xiuyuan Cheng
- Roland Denis
- Tianbao Yang
- Zheming Zuo
- Dieter Hogrefe
- Kai Xu
- Xiaodong He
- Han Xu
- Hans D. Schotten
- Simon Masnou
- Alexander Cloninger
- Neil Hernández-Gress
- Guangyi Liu
Venues
- CoRR
- ICASSP
- Sensors
- NeurIPS
- Sci. China Inf. Sci.
- NeuroImage
- CIKM
- KDD
- ITC
- ICCE
- IEEE Access
- ESEM
- ERCIM News
- J. Syst. Softw.
- URAI
- ISSTA
- ACI
- COLING
- Asian Test Symposium
- OFC
- EURASIP J. Adv. Signal Process.
- Int. J. Comput. Math.
- IEEE Trans. Signal Process.
- EDUCON
- CAMAD
- AHFE (6)
- CinC
- ICTSS
- EMBC
- COST 2102 Workshop (Patras)
- EDM
- IEEE Trans. Inf. Forensics Secur.
- SSIAI
- SODA
- ICAART (1)
- SEKE
- VTS
- DAC
- INTERSPEECH
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