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Non-invasive RF built-in testing using on-chip temperature sensors.
Eduardo Aldrete-Vidrio
Marvin Onabajo
Josep Altet
Diego Mateo
José Silva-Martínez
Published in:
ITC (2009)
Keyphrases
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high speed
test cases
radio frequency
low cost
relevance feedback
wireless sensor networks
high density
vlsi implementation
analog vlsi
database
information retrieval
search engine
image processing
test suite
circuit design
single chip