Non-invasive RF built-in testing using on-chip temperature sensors.

Eduardo Aldrete-Vidrio Marvin Onabajo Josep Altet Diego Mateo José Silva-Martínez

Published in: ITC (2009)

Keyphrases

high speed
test cases
radio frequency
low cost
relevance feedback
wireless sensor networks
high density
vlsi implementation
analog vlsi
database
information retrieval
search engine
image processing
test suite
circuit design
single chip