RF SPUTTERING
Experts
- George J. Papaioannou
- Takayoshi Kubono
- Junya Sekikawa
- Tero Kaipia
- Robert Weigel
- Antti Pinomaa
- Pasi Nuutinen
- Yong Zhao
- Pertti Silventoinen
- Francisco Javier De Moure-Flores
- A. A. Dakhel
- Ri-Qing Lv
- Loukas Michalas
- Nagarjuna Neella
- Robert Plana
- Jose Santos-Cruz
- Diego Mateo
- Juha-Pekka Ström
- Yue Hao
- Masayuki Yamato
- Yasuhiro Matsumoto
- Yoshikatsu Akiyama
- Wilfrid Claeys
- Konandur Rajanna
- Ana Collado
- Markus Zahn
- Apostolos Georgiadis
- Mohamed Ghorbel
- Venkateswarlu Gaddam
- Xue Zhou
- Kang-Yoon Lee
- Paul A. Bottomley
- S. Pinarello
- Carlos Rinaldi
- Ergin Atalar
- Shailesh Singh Chouhan
- Matroni Koutsoureli
- Josep Altet
- Stéphane Grauby
Venues
- IEEE Trans. Instrum. Meas.
- Microelectron. Reliab.
- Microelectron. J.
- Sensors
- IEICE Trans. Electron.
- IEEE Access
- NEMS
- IEEE SENSORS
- CCE
- ISCAS
- EMBC
- Symmetry
- IEEE Trans. Ind. Electron.
- ICECS
- J. Vis.
- IRPS
- Sci. China Inf. Sci.
- IBM J. Res. Dev.
- IECON
- RWS
- J. Sensors
- CoRR
- ICTON
- IEEE Trans. Smart Grid
- LASCAS
- 3DIC
- VLSI Design
- IEEE Trans. Circuits Syst. II Express Briefs
- ICMENS
- AUTOMATION
- ESSDERC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- MHS
- ISOCC
- MWSCAS
- Int. J. Bifurc. Chaos
- IEEE J. Solid State Circuits
- Entropy
- ICUWB
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