S. Pinarello

Publication Activity (10 Years)

Years Active: 2014-2015
Publications (10 Years): 0

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Genetic Algorithm

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Publications

Andrea Cattaneo, S. Pinarello, J. E. Mueller, Robert Weigel
Impact of DC and RF non-conducting stress on nMOS reliability. IRPS (2015)
Andrea Cattaneo, S. Pinarello, J. E. Mueller, Robert Weigel
MOSFET degradation under DC and RF Fowler-Nordheim stress. ESSDERC (2014)