Login / Signup

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.

G. AndriamonjeVincent PougetYves OustenDean LewisYves DantoJean-Michel RampnouxYounès EzzahriStefan DilhaireStéphane GraubyWilfrid Claeys
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • vlsi circuits
  • data analysis
  • image analysis
  • data model
  • digital images
  • hardware and software