Strain energy imaging of a power MOS transistor using speckle interferometry.
Stefan DilhaireStéphane GraubySébastien JorezWilfrid ClaeysPublished in: IEEE Trans. Reliab. (2004)
Keyphrases
- strain energy
- power consumption
- imaging systems
- low power
- high speed
- integrated circuit
- ultrasound images
- power dissipation
- sar images
- image analysis
- low contrast
- medical ultrasound
- floating gate
- image segmentation
- image processing
- synthetic aperture
- computer vision
- steady state
- gray level
- noise reduction
- real time
- medical images
- power distribution