Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Jean-Yves DelétageF. J.-M. VerdierBernard PlanoYannick DeshayesLaurent BéchouYves DantoPublished in: Microelectron. Reliab. (2003)
Keyphrases
- computational model
- probabilistic model
- mathematical model
- statistical model
- parameter values
- sensitivity analysis
- objective function
- autoregressive
- parameter estimation
- constraint satisfaction problems
- transfer function
- neural network
- parametric models
- linear model
- bayesian framework
- experimental data
- theoretical analysis
- model selection
- cost function
- high level