High reliability level demonstrated on 980nm laser diode.

J. Van de Casteele Dominique Laffitte G. Gelly C. Starck M. Bettiati

Published in: Microelectron. Reliab. (2003)

Keyphrases

high reliability
high precision
low cost
low overhead
higher level
real time
image processing
decision trees
multiscale
data structure
levels of abstraction
remote control