Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation.
Yannick DeshayesIsabelle Bord-MajekG. BarreauM. AicheP. H. MorettoLaurent BéchouA. C. RoehrigYves OustenPublished in: Microelectron. Reliab. (2008)