E. Suhir

Publication Activity (10 Years)

Years Active: 2007-2015
Publications (10 Years): 2

Top Topics

Statistical Models

Physical Processes

Top Venues

Microelectron. Reliab.

Publications

A. Bensoussan, E. Suhir, P. Henderson, M. Zahir
A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation. Microelectron. Reliab. 55 (9-10) (2015)
E. Suhir, A. Bensoussan, Golta Khatibi, Johann Nicolics
Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challenges. IRPS (2015)
E. Suhir
Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann-Arrhenius-Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical models. Microelectron. Reliab. 54 (11) (2014)
E. Suhir
Thermal stress in through-silicon-vias: Theory-of-elasticity approach. Microelectron. Reliab. 54 (5) (2014)
E. Suhir, Laurent Béchou
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing. Microelectron. Reliab. 53 (9-11) (2013)
E. Suhir
When adequate and predictable reliability is imperative. Microelectron. Reliab. 52 (9-10) (2012)
W. Gschohsmann, Johann Nicolics, E. Suhir
Elastizitätsmodell eines keramischen Sensorstreifens bei longitudinaler Verformung. Elektrotech. Informationstechnik 127 (10) (2010)
E. Suhir
Response of a heavy electronic component to harmonic excitations applied to its external electric leads. Elektrotech. Informationstechnik 124 (9) (2007)