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P. Henderson
Publication Activity (10 Years)
Years Active: 2015-2015
Publications (10 Years): 1
Top Topics
Prior Knowledge
High Level
Computer Simulation
Unified Model
Top Venues
Microelectron. Reliab.
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Publications
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A. Bensoussan
,
E. Suhir
,
P. Henderson
,
M. Zahir
A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation.
Microelectron. Reliab.
55 (9-10) (2015)