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A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation.
A. Bensoussan
E. Suhir
P. Henderson
M. Zahir
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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theoretical analysis
high level
similarity measure
computational model
mathematical model
experimental data
unified model
objective function
prior knowledge
hidden markov models
computer simulation
formal model
modeling method