Login / Signup
Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann-Arrhenius-Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical models.
E. Suhir
Published in:
Microelectron. Reliab. (2014)
Keyphrases
</>
statistical models
statistical modeling
statistical model
physical models
highly reliable
physical processes
probabilistic model
parameter estimation
failure rate
bayesian networks
magnetic resonance
dynamical models
mr images
medical images
probability theory
computer science
video sequences