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Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation.
Guillaume Hubert
Laurent Artola
D. Regis
Published in:
Integr. (2015)
Keyphrases
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sensitivity analysis
error rate
error bounds
x ray
error propagation
high impact
legal issues
data mining
statistical analysis
learning systems
generalization error
error analysis
emerging technologies
high sensitivity