Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection.
Nasr-Eddine Ouldei TebinaLaurent MaingaultNacer-Eddine ZergainohGuillaume HubertPaolo MaistriPublished in: IOLTS (2023)
Keyphrases
- x ray
- fault injection
- java card
- security level
- medical imaging
- digital x ray images
- cone beam
- x ray images
- ct scans
- intraoperative
- smart card
- fault model
- computer aided diagnosis
- security requirements
- three dimensional
- electron microscopy
- single photon emission computed tomography
- security analysis
- spect images
- security model
- image registration
- tomographic images
- key management
- countermeasures
- fluoroscopic images
- computer tomography