Laser-induced fault effects in security-dedicated circuits.
Régis LeveuglePaolo MaistriPierre VanhauwaertFeng LuGiorgio Di NataleMarie-Lise FlottesBruno RouzeyreAthanasios PapadimitriouDavid HélyVincent BeroulleGuillaume HubertStephan De CastroJean-Max DutertreAlexandre SarafianosNoemie BoherMathieu LisartJoel DamiensPhilippe CandelierClément TavernierPublished in: VLSI-SoC (2014)
Keyphrases
- information security
- fault injection
- failure modes
- fault models
- fault detection
- security requirements
- access control
- statistical databases
- security analysis
- high speed
- fault diagnosis
- laser beam
- security threats
- security level
- fault model
- functional requirements
- fault tolerant
- smart card
- real time
- information assurance
- java card
- circuit design
- cyber security
- computer security
- security issues
- network security
- low cost