Philippe Candelier

Publication Activity (10 Years)

Years Active: 2009-2018
Publications (10 Years): 6

Top Topics

Malicious Activities

Top Venues

Publications

Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC (2018)
Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS (2018)
Noemie Beringuier-Boher, Vincent Beroulle, David Hély, Joel Damiens, Philippe Candelier
Clock generator behavioral modeling for supply voltage glitch attack effects analysis. Microprocess. Microsystems 47 (2016)
Daniele Garbin, Elisa Vianello, Olivier Bichler, M. Azzaz, Quentin Rafhay, Philippe Candelier, Christian Gamrat, Gérard Ghibaudo, Barbara De Salvo, Luca Perniola
On the impact of OxRAM-based synapses variability on convolutional neural networks performance. NANOARCH (2015)
M. Azzaz, A. Benoist, Elisa Vianello, Daniele Garbin, Eric Jalaguier, Carlo Cagli, C. Charpin, Stefania Bernasconi, Simon Jeannot, T. Dewolf, G. Audoit, C. Guedj, S. Denorme, Philippe Candelier, Claire Fenouillet-Béranger, Luca Perniola
Benefit of Al2O3/HfO2 bilayer for BEOL RRAM integration through 16kb memory cut characterization. ESSDERC (2015)
A. Benoist, S. Denorme, X. Federspiel, Bruno Allard, Philippe Candelier
Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology. IRPS (2015)
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC (2014)
Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS (2014)
Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) (2014)
Kamil Gomina, Jean-Baptiste Rigaud, Philippe Gendrier, Philippe Candelier, Assia Tria
Power supply glitch attacks: Design and evaluation of detection circuits. HOST (2014)
Noemie Beringuier-Boher, Kamil Gomina, David Hély, Jean-Baptiste Rigaud, Vincent Beroulle, Assia Tria, Joel Damiens, Philippe Gendrier, Philippe Candelier
Voltage Glitch Attacks on Mixed-Signal Systems. DSD (2014)
Kamil Gomina, Philippe Gendrier, Philippe Candelier, Jean-Baptiste Rigaud, Assia Tria
Detecting positive voltage attacks on CMOS circuits. CS2@HiPEAC (2014)
Kamil Gomina, Jean-Baptiste Rigaud, Philippe Gendrier, Philippe Candelier, Assia Tria
Power analysis methodology for secure circuits. DDECS (2013)
Noemie Beringuier-Boher, David Hély, Vincent Beroulle, Joel Damiens, Philippe Candelier
Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology. ISQED (2013)
Elodie Ebrard, Bruno Allard, Philippe Candelier, Patrice Waltz
Review of fuse and antifuse solutions for advanced standard CMOS technologies. Microelectron. J. 40 (12) (2009)