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Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology.
A. Benoist
S. Denorme
X. Federspiel
Bruno Allard
Philippe Candelier
Published in:
IRPS (2015)
Keyphrases
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power law
high voltage
cmos technology
silicon on insulator
metal oxide semiconductor
nm technology
small world
low power
power law distribution
power consumption
low cost
long range correlations
normal operation
scale free
clustering coefficient
high speed
data mining
real world graphs
partial discharge