Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model.
Jean-Max DutertreVincent BeroullePhilippe CandelierStephan De CastroLouis-Barthelemy FaberMarie-Lise FlottesPhilippe GendrierDavid HélyRégis LeveuglePaolo MaistriGiorgio Di NataleAthanasios PapadimitriouBruno RouzeyrePublished in: FDTC (2018)