Laser-Induced Fault Effects in Security-Dedicated Circuits.
Vincent BeroullePhilippe CandelierStephan De CastroGiorgio Di NataleJean-Max DutertreMarie-Lise FlottesDavid HélyGuillaume HubertRégis LeveugleFeng LuPaolo MaistriAthanasios PapadimitriouBruno RouzeyreClément TavernierPierre VanhauwaertPublished in: VLSI-SoC (Selected Papers) (2014)
Keyphrases
- failure modes
- access control
- intrusion detection
- fault diagnosis
- information security
- network security
- high speed
- fault injection
- security issues
- fault detection
- security problems
- analog circuits
- statistical databases
- security requirements
- security threats
- security policies
- functional requirements
- security mechanisms
- security analysis
- security level
- security management
- security measures
- information systems