LASER BEAM
Experts
- Emiliano Schena
- Paola Saccomandi
- Daniele Tosi
- Takeshi Tsujimura
- Kiyotaka Izumi
- Wojtek J. Bock
- Kazuhiro Watanabe
- Carlo Massaroni
- Sergio Silvestri
- Tsu-Chin Tsao
- Michiko Nishiyama
- Ignacio R. Matías
- Radek Martinek
- Fumihito Arai
- Leonardo S. Mattos
- Ningfang Song
- Lijun Xu
- Fang Li
- Wenzhu Huang
- Erik Agrell
- Xingwei Wang
- Wentao Zhang
- Koichiro Adachi
- Zhang Cao
- Norbert Hanik
- Biswanath Mukherjee
- Stefan Kleszczynski
- Fumio Koyama
- Jing Jin
- Darwin G. Caldwell
- Joschka zur Jacobsmühlen
- Wook Jae Yoo
- Guido Perrone
- Jie Huang
- Kyoung Won Jang
- Alberto Vallan
- Masataka Nakazawa
- Ting Wang
- Jawad A. Salehi
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- OFC
- CoRR
- IEEE Access
- ICTON
- IEEE SENSORS
- IEEE Trans. Commun.
- IEEE J. Sel. Areas Commun.
- ECOC
- EMBC
- I2MTC
- J. Sensors
- NEMS
- Remote. Sens.
- ICAIT
- IEEE Trans. Geosci. Remote. Sens.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- IEICE Electron. Express
- Int. J. Autom. Technol.
- IGARSS
- IEEE Trans. Biomed. Eng.
- ICRA
- PHOTOPTICS
- IROS
- Proc. IEEE
- IEEE Commun. Mag.
- ACC
- Prod. Eng.
- J. Vis.
- IEEE J. Solid State Circuits
- OECC/PSC
- Symmetry
- SIU
- Microelectron. J.
- IEEE Robotics Autom. Lett.
- Int. J. Bifurc. Chaos
- ICC
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