Login / Signup

Robustness improvement of an SRAM cell against laser-induced fault injection.

Alexandre SarafianosMathieu LisartOlivier GaglianoValerie SerradeilCyril RoscianJean-Max DutertreAssia Tria
Published in: DFTS (2013)
Keyphrases
  • fault injection
  • java card
  • fault model
  • power consumption
  • computational efficiency
  • low cost
  • data management
  • data transmission