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Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory.

Roxane LlidoJ. GomezVincent GoubierN. FroidevauxL. DufayardGérald HallerVincent PougetDean Lewis
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • high density
  • image analysis
  • statistical analysis
  • power consumption
  • image processing
  • data analysis
  • real time
  • data sets
  • genetic algorithm
  • computer vision
  • video sequences