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Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection.

Vincent PougetAlexandre DouinGilles FoucardPaul PeronnardDean LewisPascal FouillatRaoul Velazco
Published in: IOLTS (2008)
Keyphrases
  • fault injection
  • java card
  • fault model
  • low cost
  • static analysis
  • power consumption