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Accelerated lifetime test of RF-MEMS switches under ESD stress.

Jinyu Jason RuanNicolas NolhierGeorge J. PapaioannouDavid TrémouillesVincent PuyalC. VilleneuveT. IddaFabio CoccettiRobert Plana
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • test data
  • learning algorithm
  • computer vision
  • radio frequency
  • real world
  • metadata
  • data structure
  • data streams
  • image retrieval
  • supply chain
  • energy consumption
  • long period