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Life expectancy and characterization of capacitive RF MEMS switches.

Mohamed MatmatK. KoukosFabio CoccettiT. IddaAntoine MartyChristophe EscribaJean-Yves FourniolsDaniel Estève
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • radio frequency
  • three dimensional
  • relevance feedback
  • digital libraries
  • expert systems
  • artificial neural networks