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Investigation of charging mechanisms in metal-insulator-metal structures.

M. A. ExarchosV. TheonasPatrick PonsGeorge J. PapaioannouS. MelléDavid DubucFabio CoccettiRobert Plana
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • high temperature
  • field effect transistors
  • grain size
  • multiscale
  • welding process
  • database
  • real time
  • databases
  • machine learning
  • computer vision
  • probabilistic model
  • high density
  • mechanisms underlying